The 3D laser scanning microscope from the VK-X3000 series uses three different measuring principles combined in one device; depending on the application, a confocal laser, focus variation and white light interferometry can be used. This enables high-precision measurements and analyzes of various measurement objects to be carried out with a maximum resolution of 0.01 nm. Quick acquisition of measuring ranges of up to 50 × 50 mm is possible, even for measuring objects the size of a palm or those with large height differences. This allows for quick analysis of both overall shape and specific areas. Even difficult materials, such as those with transparent and reflective surfaces, can be measured quickly, with high accuracy and over large areas. This 3D laser scanning microscope can measure measurement objects regardless of magnification, surface roughness and texture (transparent/reflective surfaces).
